RF and Wireless Measurements
This topic explains essential RF measurements that must be made on modern wireless communications equipment. The newest models of the necessary RF test equipment are explained and demonstrated, including vector network analyzers, spectrum analyzers, digitally modulated signal generators and vector signal analyzers.
This 5-day lecture-based course explains essential RF measurements that must be made on modern wireless communications equipment - cellular, PCS and 3G phones, wireless LANs, GPS navigation systems, and DBS TV. The newest models of the necessary RF test equipment will be explained and demonstrated, including vector network analyzers, spectrum analyzers, digitally modulated signal generators and vector signal analyzers. Significant class time is dedicated to demonstrations.
Includes a review of basic RF and wireless fundamentals.
This online program offers the fastest route to getting the background you need to understand RF measurements. The four parts of the program each provide an essential toolkit for working effectively with RF and wireless devices. Part 1 covers the basic analytical tools used in RF such as the dB scale, S-parameters, and the Smith Chart. Part 2 covers the principles behind digital modulation techniques. Part 3 gives an introduction to the specialized test equipment (VNA, Spectrum Analyzer, VSA) used at RF and most importantly the limitations caused by mismatch and reflections. Part 4 walks through each component in a transmit/receive block diagram and explains the principles of operation while introducing the relevant performance parameters such as gain, noise figure, IP3, etc. The entire program is completed online at your own pace over the course of about six months and features recorded lectures, online workbooks, and guest tutorials. Upon successful completion of the four online tests you will receive a signed certificate. Sep 22-Feb 28, 2018: Live Web Conference, RF Mentor e-Learning: Presented by: Rex Frobenius
This course includes coverage of antenna testing techniques. Please see the course outline for more information. Feb 26-Feb 27, 2018: San Diego, CA: Presented by: Steven Best
A combination of three popular topics in one course, this five day course features material covering linear circuit design, system level design, and measurements. Please check the course outline for the last day to see measurement topics covered.
This course discusses measurements in the context of designing a product that uses digital modulation. Approximately one day is spent on the subject of measurements. Please review the course outline, day two.
This course is a good follow-on course to #135, offering greater understanding of the Smith Chart and S-parameters and then moving on to device modeling and de-embedding on the last day. This course could be a good alternative to the five-day Applied RF Techniques I (#001) course for people who are only concerned with measurements.